If your data is not perfect, you need this book! 316 pages immediately tells you that "EMP III" is way more than a new edition of the old green book (Evaluating the Measurement Process). This is a whole new book! "EMP III" expands and updates the classic procedures. It also goes beyond these procedures to include the explanations of why the procedures work. Additionally, it includes a new way of characterizing measurement systems and provides illustrations of problems with the traditional techniques.
Nearly 30 Reasons why you need "EMP III":
- Your data are less than perfect.
- Your data are never going to be perfect.
- You need to quit messing with the measurement system and get the job done!
- Learn how to do an Honest Gauge R&R Study.
- Learn how to characterize each application of a measurement system.
- Discover the difference between Observational Studies and Experimental Studies and the different types of analyses used for each.
- Learn how to place Censored Data on a Process Behavior Chart.
- Learn how some measurement system applications will only let you detect process deterioration while others will let you detect both deterioration and improvement.
- Learn how to distinguish between four different ways we use measurements.
- Learn to use a Consistency Chart to track a measurement system, characterize measurement uncertainty, and check for bias in the measurements.
- Learn how to evaluate destructive tests.
- Learn how to use Consistency Charts with Subjective Measurements.
- Discover what each of the values produced by a traditional Gauge R&R Study actually represents.
- Discover why the Probable Error defines the effective resolution of a measurement.
- Learn how Chunky Data affects the charts.
- Learn how using the appropriate measurement increment can eliminate the problems of Chunky Data.
- Learn how to use multiple determinations in Short EMP Studies.
- Discover the four different paths through a Basic EMP Study, using the NEW Flowchart.
- Incorporate ANOME and ANOMR techniques into your Basic EMP Study.
- Benefit from new guidelines for assessing the parallelism in EMP Studies.
- Learn how to do Two-Factor EMP Studies with nuisance components that are crossed or nested.
- Discover the full explanation of the basis for manufacturing specifications.
- Benefit from new explanations of the problems of Prediction and Representation.
- Discover the role and scope of Acceptance Sampling.
- Learn how to use the concept of a Grand Lot.
64 Examples and Case Histories.
Expert Advice Donald J. Wheeler, Ph.D., is a consulting statistician who had the good fortune to work with W. Edwards Deming and David S. Chambers. Dr. Wheeler graduated from the University of Texas at Austin with bachelor's degrees in physics and mathematics, and has master's and doctorate degrees in statistics from Southern Methodist University. From 1970 to 1982 he taught in the statistics department at the University of Tennessee, Knoxville, where he was an associate professor. Between 1981 and 1993, he periodically assisted Dr. Deming with his four-day seminars. He is the author of more than 15 books and more than 60 articles. Dr. Wheeler is a fellow of the American Statistical Association.
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| Weight | 2.13 lbs |
| ISBN: | N/A |
| Pages: | 316; hardcover |
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